This article proposes a more general method of yield analysis based on the quality transfer function of a Bernoulli process. In the spatial domain the procedure is well-known as spatial yield analysis, but the author has extended the method to include...
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This article proposes a more general method of yield analysis based on the quality transfer function of a Bernoulli process. In the spatial domain the procedure is well-known as spatial yield analysis, but the author has extended the method to include temporal yield analysis. The method should be of considerable interest to those practicing yield improvement in the semiconductor industry, such as device engineers, yield enhancement engineers, and failure analysis engineer because the method also explains the origins of yield entitlement, or functional entitlement, and non-linear spatial analysis curves.
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