New Semiconductor Water Inspection System Technology:
Introduction of new Surfscan SP2XP, a new monitor for wafer inspection system for the integrated circuit
has built a success upon its predecessor tool with the same name.
The new wafer inspection...
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New Semiconductor Water Inspection System Technology:
Introduction of new Surfscan SP2XP, a new monitor for wafer inspection system for the integrated circuit
has built a success upon its predecessor tool with the same name.
The new wafer inspection system
features improved sensitivity to defects on silicone, poly and metal films.
It also has the ability to sort
defects by the type and size.
This new semiconductor wafer inspection system also features vacuum
handling and best-in- class through put.
This wafer inspections system is designed and manufactured to
enable facilitate chipmakers to bring in their devices to the market with superior quality and in minimal
amount of time.
This system has an integrated ultra high sensitivity operating mode to speed up the
process of development of next generation devices.
This SP2 wafer inspection system is designed for 65 and 45 nm nodes and below.
This slip in new UV
laser technology, dark field optics and advanced algorithms.
This tool
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